Extremely Dynamic 4DOF Piezo Wafer Stage for Inspection and Metrology, new from PI – Uplaza

Leveraging a long time of piezo nanopositioning know-how expertise, introducing at 2024 Semicon West.

Auburn, MA – PI’s latest wafer inspection answer relies on a hybrid kinematics design, combining Piezo-Stroll motors and piezo stacks to attain each lengthy journey and extremely dynamic, ultra-precise movement. This built-in 4-DOF answer reduces gear complexity, integration efforts, prices, and dangers.

Picture Credit score: Physik Instrumente

Piezo-Stroll motors are self-locking at relaxation, including no servo dither and warmth, not like different movement strategies. The excessive bandwidth of the short-travel piezo stack actuators permits for dynamic monitoring and error compensation of exterior disturbances (e.g., from lengthy journey XY wafer levels).

The 4DOF module also can appropriate for rotational wafer misalignment and takes wafer thickness and machine static traits into consideration.

The high-stiffness design of the Tip-Tilt drive module supplies extraordinarily quick step and settle (

Extra info on Piezo Stage for Wafer Inspection & Metrology

PI’s superior design experience and lengthy expertise as a provider to high tier semiconductor producers and main system integrators permits us to grasp and meet the excessive calls for of the trade, together with copy precisely and assembly strict cleanroom necessities.

Industries Served
Semiconductors, Metrology, Optics, Photonics

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